A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

For almost two decades, scientists have been trying to move beyond silicon, the material ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Intel Corp. said Wednesday that it has redesigned the electronic switches on its chips so that computers can keep getting cheaper and more powerful. The switches, known as transistors, have typically ...