A research team of fusion scientists has succeeded in developing "the nano-scale sculpture technique" to fabricate an ultra-thin film by sharpening a tungsten sample with a focused ion beam. This ...
JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM ...
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In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...
These two common methods are used to prepare electron transport specimens for a range of materials including metals, semiconductors and ceramics. FIB is feasible in cases when there is a need for ...
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