The HR-E 40-1 passive near-field probe from Langer EMV-Technik measures electrical RF fields up to 40 GHz. Designed to be connected to a spectrum analyzer, oscilloscope, or similar device, the probe ...
As new tracking technologies emerge that promise a future where nothing is ever lost, researchers are taking the idea one step further. Why spend precious minutes following sound or visual cues when ...
Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...
Electrical resistivity is a basic property that quantifies a material’s opposition to current flow—it’s the reciprocal of conductivity. The resistivity of a material depends upon several factors, ...
No longer must you choose either SEM or FIB for failure analysis. Now there�s in situ testing using a dual-beam FIB/SEM tool. Traditionally, testing and failure analysis of integrated circuits (ICs) ...
Scientific American is part of Springer Nature, which owns or has commercial relations with thousands of scientific publications (many of them can be found at www ...
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