STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...
The use of memory-heavy IP in SoCs for automotive, artificial intelligence (AI), and processor applications is steadily increasing. However, these memory-heavy IP often have only a single access point ...
Palo Alto, Calif.—Automatic test equipment maker Agilent Technologies now has a new final-test memory tester targeting MCP s (multi-chip packages) and discrete flash. Dubbed the Versatest Series Model ...
Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...
Dedicated memory tests on smartphones enable the detection of “mild cognitive impairment”, a condition that may indicate Alzheimer’s disease, with high accuracy. Researchers from DZNE, the ...
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