Scanning Capacitance Microscopy (SCM) and Scanning Spreading Resistance Microscopy (SSRM) are both well-established scanning probe-based techniques for two-dimensional carrier profiling. Driven by the ...

At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...

Spatial resolution of less than 10 nm has been identified as a requirement for accurate and quantitative two-dimensional dopant profiling by the International Technology Roadmap for Semiconductors ...

Complex interrelated phenomena lead to battery failure, which is dependent on battery design, environment, chemistry, and true operation conditions. Therefore, studies at the component level are ...

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents ...

Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...