Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
Anyone involved in IC product sign-off that includes a mixed signal design portion knows that developing robust tests for these intricate designs has historically been a significant bottleneck, no ...
Power-aware test is a major manufacturing consideration due to the problems of increased power dissipation in various test modes, as well as test implications that come up with the usage of various ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
With increasing numbers of ASICs finding their way into high-volume products, production testing of these devices must be fast, complete, trouble-free, and economical. To achieve these goals, ...
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