EDN

Electroglas adds auto defect classification to wafer inspection

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...
JD Supra

One Size Fits None: Sixth Circuit Demands State-by-State Analysis in Auto Defect Class Actions

The U.S. Court of Appeals for the Sixth Circuit, in a full en banc decision, raised the pleading and proof standards for plaintiffs seeking to certify multistate automotive defect class actions. The ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Nature

Semiconductor Wafer Defect Pattern Recognition and Classification

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...
Just Auto

Nissan brake defect class actions decertified by US court

Nissan developed “distinct” software upgrades for different models. Credit: JRomero04/Shutterstock. Nissan has successfully convinced a US federal appeals court to decertify ten class actions related ...
Semiconductor Engineering

Fabs Drive Deeper Into Machine Learning

Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...
Business Wire

Class Action Lawsuit Filed Against Porsche Alleging Dangerous Battery Defect in Taycan Electric Vehicles by Gibbs Law Group

OAKLAND, Calif.--(BUSINESS WIRE)--Gibbs Law Group has filed a class action lawsuit against Porsche for allegedly failing to disclose or adequately repair a dangerous defect in the 800V lithium-ion ...