AZoNano

Sample Scanning with the TT-AFM from AFM Workshop

This video (Part 3 of 3) provides a demonstration of the TT-AFM from AFM Workshop. It shows the entire process from loading a sample to obtaining results. The process involves the following steps: ...
AZoNano

A Guide to AFM Sample Preparation

Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...
AZOM

Using AFM-IR for the Nanoscale Chemical Characterization of Polymeric and Thin Film Samples

In government, academic, and industrial research and development laboratories, infrared (IR) spectroscopy is regarded as one of the most established analytical measurement methods for characterizing ...
Business Insider

Park Systems Introduces Park NX-TSH a High Resolution, Automated Tip Scanning Head (TSH) for Industrial Large Sample AFM at Semicon China and Semicon West

SANTA CLARA, Calif., June 23, 2020 /PRNewswire-PRWeb/ -- Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large ...